1.

Tsung-Kuei Kang, Ta-Chuan Liao, Han-Wen Liu, Fang-Hsing Wang, Wen-Fa Wu, “Effects of different tunnel layers on retention characteristics for Pd-nanocrystal-based nonvolatile memory,” Microelectronic Engineering, no. 95, pp. 59-64, 07 2012. (SCI)

2.

Hung-Hsien Li, Kuan-Heng Chen, Si-Ming Chiou, Han-Wen Liu, Chuan-Ping Juan, and Huang-Chung Cheng, “Coaxial-Structured Solar Cells with Silicon Nanostructures,” ECS Transactions, vol. 3, no. 45, pp. 529-535, 03 2012. (EI)

3.

Han-Wen Liu, Si-Ming Chiou, Han-Ching Ho and Fang-Hsing Wang, “Degradation of n-channel low temperature poly-Si TFTs dynamically stressed in OFF region with positive drain bias,” Microelectronic Engineering, no. 89, pp. 37-41, 01 2012. (SCI)

4.

Tsung-Kuei Kang, Ta-Chuan Liao, Chia-Min Lin, Han-Wen Liu, Fang-Hsing Wang, and Huang-Chung Cheng, “Gate-All-Around Poly-Si TFTs With Single-Crystal-Like Nanowire Channels,” IEEE Electron Device Lett., vol. 9, no. 32, 09 2011. (SCI)

5.

Tsung-Kuei Kang, Han-Wen Liu, Fang-Hsing Wang, Cheng-Li Lin, Ta-Chuan Liao, Wen-Fa Wu, “Improved characteristics for Pd nanocrystal memory with stacked HfAlO–SiO2 tunnel layer,” Solid-State Electronics, vol. 1, no. 61, pp. 100-105, 07 2011. (SCI)

6.

Hung-Hsien Li, Po-Yu Yang, Si-Ming Chiou, Han-Wen Liu, and Huang-Chung Cheng, “A Novel Coaxial-Structured Amorphous-Silicon p-i-n Solar Cell With Al-Doped ZnO Nanowires,” IEEE Electron Device Lett., vol. 7, no. 32, pp. 928-930, 07 2011. (SCI)

7.

Tsung-Kuei Kang, Ta-Chuan Liao, Chia-Min Lin, Han-Wen Liu and Huang-Chung Cheng, “High-Performance Single-Crystal-Like Nanowire Poly-Si TFTs With Spacer Patterning Technique,” IEEE Electron Device Lett., vol. 3, no. 32, pp. 330-332, 03 2011. (SCI)

8.

Hung-Peng Chang, Fang-Hsing Wang, Jen-Chi Chao, Chia-Cheng Huang, and Han-Wen Liu, “Effects of thickness and annealing on the properties of Ti doped ZnO films by radio frequency magnetron sputtering,” Current Applied Physics, vol. 1, no. 11, 01 2011. (SCI)

9.

Fang-Hsing Wang, Hung-Peng Chang, Chih-Chung Tseng, Chia-Cheng Huang, and Han-Wen Liu, “Influence of Hydrogen Plasma Treatment on Al-doped ZnO Thin Films for Amorphous Silicon Thin Film Solar Cells,” Current Applied Physics, vol. 1, no. 11, pp. s12-s16, 01 2011. (SCI)

10.

Han-Wen Liu, Si-Ming Chiou, Hui-Ching Huang, Jeng Gong and Fang-Hsing Wang, “Superior Reliability of Gate-All-Around Polycrystalline Silicon Thin-Film Transistors with Vacuum Cavities next to Gate Oxide Edges,” Jpn. J. Appl. Phy., vol. 1, no. 50, pp. 014202, 01 2011. (SCI)

11.

Han-Wen Liu, Si-Ming Chiou, and Fang-Hsing Wang, “Turn-Around Phenomenon in the Degradation Trend of n-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors under DC Bias Stress,” Jpn. J. Appl. Phy, vol. 7, no. 49, pp. 074103, 07 2010. (SCI)

12.

H. P. Chang, F. H. Wang, J. Y. Wu, C. Y. Kung and H. W. Liu,, “Enhanced Conductivity of Aluminum Doped ZnO Films by Hydrogen Plasma Treatment,” Thin Solid Films, no. 518, pp. 7445-7449, 05 2010. (SCI)

13.

Han-Wen Liu, Si-Ming Chiou, Chung-En Hung and Fang-Hsing Wang,, “Characterization and Reliability of Gate-All-Around Poly-Si TFTs With Multi-Nanowire Channels,” ECS Transactions, vol. 5, no. 33, pp. 197-204, 03 2010. (EI)

14.

Han-Wen Liu, Si-Ming Chiou and Fang-Hsing Wang,, “The Reliability of LTPS TFTs Alternately Stressed in OFF Region,” ECS Transactions, vol. 21, no. 28, pp. 89-96, 01 2010. (EI)

15.

Wang Fang-hsing, Lin Chih-ying, Chang Hung-peng, Liu Han-Wen, “A New Complementary Mirror Type Analog Buffer for LTPS TFT-LCD Data Drivers,” Chinese Journal of Electron Devices, vol. 1, no. 31, pp. 100-104, 02 2008. (EI)

16.

Jiang Wei-shan, Liu Han-Wen, Huang Nan-xiong, Tsao Ming-yuan, Chang Robert Chen-hao and Liu Don-gey,, “One Quiescent Current and Chip Area Efficient Architecturfe of TFT-LCD Source Driver for Portable Applications,” Chinese Journal of Electron Devices, vol. 1, no. 31, pp. 260-264, 02 2008. (EI)

1.

Han-Wen Liu, Si-Ming Chiou, Fang-Hsing Wang and Tsung-Kuei Kang, “Reliability Study on the Corner Effects of Gate-All-Around Polycrystalline Silicon Thin-Film Transistors,” 9th International Thin-Film Transistor Conference-2013 ITC, 03 2013. The University of Tokyo, Tokyo, Japan,

2.

邱世明、吳佳蓉、劉漢文, “利用金字塔結構及不同碳摻雜P型非晶矽層製作異質接面太陽能電池之特性研究,” Optics & Photonics Taiwan, International Conference 2012(OPTIC 2012, formerly OPT 2012), 12 2012. National Taiwan University, Taipei, Taiwan,

3.

Han-Wen Liu, Si-Ming Chiou, Po-Chun Chan, Chung-Yuan Kung, Fang-Hsing Wang, and Tsung-Kuei Kang, “Degradation of p-Channel Low Temperature Poly-Si TFTs with Positive Source Pulse Stress,” PRiME 2012 & 222nd ECS meeting, pp. Abs.#3073, 10 2012. Honolulu, Hawaii, USA,

4.

Hung-Hsien Li, Jung-Kuei Tseng, Si-Ming Chiou, Han-Wen Liu, and Huang-Chung Cheng, “Fabrication of Silicon Nanowire Arrays for Photovoltaic Applications,” PRiME 2012 & 222nd ECS meeting, pp. Abs.#2693, 10 2012. Honolulu, Hawaii, USA,

5.

Han-Wen Liu, Si-Ming Chiou, Fang-Hsing Wang and Tsung-Kuei Kang, “Superior Characteristics and Reliability of Poly-Si TFTs with Vacuum Cavities underneath Poly-Si Gate Edges,” 19th International Workshop on Active-Matrix Flatpanel Displays and Devices-AM-FPD 12, pp. 321-324, 07 2012. Ryukoku University, Kyoto, Japan,

6.

Hung-Hsien Li, Kuan-Heng Chen, Si-Ming Chiou, Han-Wen Liu, Chuan-Ping Juan, and Huang-Chung Cheng, “Coaxial-Structured Solar Cells with Silicon Nanostructures,” 221th ECS meeting, pp. Abs.#704, 05 2012. Seattle, WA, USA,

7.

Han-Wen Liu, Si-Ming Chiou, Fang-Hsing Wang, and Chung-Yuan Kung, “Electrical Properties and Instability of Multi-channeled Polycrystalline Silicon Thin-Film Transistors with Surrounding Gate Structure,” 38th International Conference on Metallurgical Coating & Thin-Films, 05 2011. San Diego, CA, USA,

8.

Han-Wen Liu, Si-Ming Chiou, Chung-En Hung, Han-Ching Ho, and Fang-Hsing Wang, “Improvements of Performance and Stability for Gate-All-Around Poly-Si TFTs Using Vacuum Cavity Structures,” 219th ECS meeting, pp. Abs.#1261, 05 2011. Montreal QC, Canada,

9.

Han-Wen Liu, Si-Ming Chiou, Han-Ching Ho, Der-Chin Wu, and Fang-Hsing Wang, “Performance and reliability improvements of poly-Si TFTs utilizing vacuum cavities next to gate-oxide edges,” 7th International Thin-Film Transistor Conference-2011 ITC, 03 2011. Carl College, Cambridge, UK,

10.

Han-Wen Liu, Si-Ming Chiou, Chung-En Hung and Fang-Hsing Wang, “Characterization and Reliability of Gate-All-Around Poly-Si TFTs With Multi-Nanowire Channels,” 218th ECS Meeting, pp. Abs.#1837, 10 2010. Las Vegas, Nevada, USA,

11.

F. H. Wang, H. P. Chang, J. C. Chao, F. J. Liu, C. C. Huang, H. H. Huang, H. W. Liu, “Influence of Plasma Treatment on Properties of Titanium-doped Zinc Oxide Sputtered Thin Films,” The 16th international conference on crystal growth/14th international conference on vapor growth and epitaxy (ICCG-16/ICVGE-14), 08 2010. Beijing , China,

12.

F. H. Wang, H. P. Chang, J. Y. Wu, C. C. Huang, H. W. Liu, “Effects of Hydrogen Doping and Post-treatment on Structural, Electrical, and Optical Properties of ZnO:Al Thin Films,” The 16th international conference on crystal growth/14th international conference on vapor growth and epitaxy (ICCG-16/ICVGE-14), 08 2010. Beijing , China,

13.

H. P. Chang, F. H. Wang, J. C. Chao, H. W. Liu, “Effects of thickness and annealing on the properties of Ti doped ZnO films by radio frequency magnetron sputtering,” International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010), 08 2010. Seoul, Korea,

14.

F. H. Wang, H. P. Chang, R. Y. Wu, C. C. Huang, H. W. Liu, “Influence of Hydrogen Plasma Treatment on Al-doped ZnO Thin Films for Amorphous Silicon Thin Film Solar Cells,” International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010), 08 2010. Seoul, Korea,

15.

Han-Wen Liu, Si-Ming Chiou, Han-Ching Ho and Fang-Hsing Wang, “Degradation of N-Channel Low Temperature Poly-Si TFTs Dynamically Stressed in OFF Region with Positive Drain Bias,” International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010), 08 2010. Seoul, Korea,

16.

F. H. Wang, H. P. Chang, J. C. Chao, H. W. Liu, “Improved Properties of Ti-doped ZnO Thin Films by Hydrogen Plasma Treatment,” The International Conference on Technological Advances of Thin Films & Surface Coatings, 07 2010. Harbin, China,

17.

F. H. Wang, H. P. Chang, H. W. Liu, “Effects of Post-treatments on Characterization of Aluminum-doped zinc oxide thin films for amorphous crystalline silicon thin film solar cells,” The International Conference on Technological Advances of Thin Films & Surface Coatings, 07 2010. Harbin, China,

18.

Han-Wen Liu, Si-Ming Chiou, Chung-En Hung, Fang-Hsing Wang and Chung-Yuan Kung, “Novel Poly-Si TFTs with Vacuum Cavity Next to the Gate-Oxide Edge,” The 23rd International Vacuum Nanoelectronics Conference - 2010IVNC, pp. 32-33, 07 2010. Palo Alto, California, USA,

19.

Han-Wen Liu, Si-Ming Chiou and Fang-Hsing Wang, “The Instability of n-type LTPS TFTs Alternately Operated in OFF Region with Drain Biased,” 17th IEEE Int. Symp. on the Physical and Failure Analysis of Integrated Circuits - IPFA 2010, pp. 130-133, 07 2010. Singapore,

20.

Han-Wan Liu, Si-Ming Chiou and Fang-Hsing Wang, “The Reliability of LTPS-TFTs Alternately Stressed in OFF Region,” 217th ECS meeting, pp. Abs.#59, 04 2010. Vancouver, Canada,

21.

Hung-Hsien Li, Po-Yu Yang, Si-Ming Chiou, I-Che Lee, Yu-Chih Hung, Han-Wen Liu, Mon-Shu Ho, M.D. Lan, and Huang-Chung Cheng, “Heterojunction ZnO Nanoswires Solar Cells,” 218th ECS Meeting, pp. Abs.#385, 01 2010. Las Vegas, Nevada, USA,

22.

Han-Wan Liu, Jhih-Yuan Wang, Sheng-Jen Lai and Fang-Hsing Wang, “The Reliability of Low Temperature Poly-Si Thin Film Transistors Dynamically Operated in OFF Region,” 2009 International Electron Devices and Materials Symposium (IEDMS), pp. GD-42, 11 2009. Taoyuan, Taiwan,

23.

F. H. Wang, H. C. Lin, P. S. Shih, L. Y. Lin, H. W. Liu, “New Current Programmed Pixel Circuit for Active-Matrix Organic Light-Emitting-Diode Displays,” 2009 IDMC-3DSA Asia Display, pp. Wed-P7-02, 04 2009. Taipei, Taiwan,

24.

Han-Wen Liu, Jiun-Yan Tsai, Wei Lai, Si-Ming Chiou and Fang-Hsing Wang, “Instability of a-Si:H TFTs Under Asynchronous AC Bias Stress,” 2008 International Electron Devices and Materials Symposium (IEDMS), pp. 1063-1066, 11 2008. Taichung, Taiwan,

25.

Han-Wan Liu, Jie-Sung Lin, Zhi-Yuan Wang, Si-Ming Chiou and Fang-Hsing Wang, “Turn-around Phenomenon of the Poly-Si Thin Film Transistor’s Degradation under DC Bias Stress,” 2008 International Electron Devices and Materials Symposium (IEDMS), pp. 1067-1070, 11 2008. Taichung, Taiwan,

26.

Han-Wen Liu, Chung-Wei Yang, Min-Feng Chien and Jun-Yan Tsai, “Study on the Reliability of a-Si:H TFTs Under AC Gate Bias Stress,” 2007 International Electron Devices and Materials Symposium (IEDMS), pp. PD-17, 11 2007. Hsinchu, Taiwan,

27.

Han-Wan Liu, Wei-Chun Chang and Jie-Sung Lin, “Study on the Reliability of P-Channel Low-Temperature Polycrystalline Silicon Thin Film Transistors with Different Channel Length under Bias Temperature Stress,” 2007 International Electron Devices and Materials Symposium (IEDMS), pp. PD-09, 11 2007. Hsinchu, Taiwan,

28.

劉漢文、洪佳民、黃昱綸, “以快速熱回火技術改善非晶矽薄膜太陽能電池特性之研究,” 2007台灣光電科技研討會(Optics and Photonics Taiwan 2007), pp. IO-011, 11 2007. Taichung, Taiwan,

29.

劉漢文、林明毅、蔡鈞諺, “以氫電漿處理改善非晶矽薄膜太陽能電池特性之研究,” 2007台灣光電科技研討會(Optics and Photonics Taiwan 2007), pp. IO-005, 11 2007. Taichung, Taiwan,

30.

Nan-Xiong Hung, Wei-Shan Jiang, Bo-Cang Wu, Ming-Yuan Tsao, Han-Wen Liu, Chen-Hao Chang, Miin-Shyue Shiau, Hong-Chong Wu, Ching-Hwa Cheng, Don-Gey Liu, “A Low Power Source Driver of Small Chip Area for QVGA TFT-LCD Applications,” 2007 International Meeting on Information Display (IMID), 08 2007. Daegu, South Korea,

31.

W.S. Jiang, H.W. Liu,M.Y. Tsao, N.X. Hung, D.G. Liu, and C.H. Chang , “One Quiescent Current and Chip Area Efficient Architecture of TFT-LCD Source Driver for Portable Applications,” 2007 Asia Display, 03 2007. 上海, 中國,

32.

H.W. Liu, Y. Y. Chen and J.G. Liu, “Reliability of p-Channel Polycrystalline Silicon Thin-Film Transistors under Constant Current Stress,” 2006 IEDMS, pp. 505-506, 11 2006. Tainan, Taiwan,

33.

H.W. Liu, W.J. Chang and J. G. Liu, “Reliability of Distinct ELA Scanned Polycrystalline Silicon Thin-Film Transistors under UV Light Exposure,” 2006 IEDMS, pp. 503-504, 11 2006. Tainan, Taiwan,

34.

H.W. Liu, M.S. Lin and C.W. Tang, “High Reliability of a-Si:H TFTs Treated by NH3 Plasma under UV Light Exposure,” 2006 IEDMS, pp. 335-336, 11 2006. Tainan, Taiwan,

35.

W.S. Jiang, M.Y. Tsao, N.X. Hung, D.G. Liu, C.H. Chang and H.W. Liu , “One Novel 262K-colors Source Driver Architecture of TFT-LCD Used in Portable Applications,” 17th VLSI Design/CAD Symposium, pp. B3-11, 07 2006. 台灣花蓮,

36.

W.S. Jiang, M.Y. Tsao, N.X. Hung, D.G. Liu, C.H. Chang and H.W. Liu, “An Area Efficient Source Driver for 262K-Colors TFT-LCD Be Used In Mobile Phone Application,” 2006 Taiwan Display Conference, pp. 257-260, 05 2006. Taipei, Taiwan,